X-Ray diffractometer
| Agency: | ENERGY, DEPARTMENT OF |
|---|---|
| State: | California |
| Type of Government: | Federal |
| FSC Category: |
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| NAICS Category: |
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| Set Aside: | Total Small Business Set-Aside (FAR 19.5) |
| Posted Date: | Jan 30, 2025 |
| Due Date: | Feb 7, 2025 |
| Solicitation No: | LBLAM20250117 |
| Original Source: | Please Login to View Page |
| Contact information: | Please Login to View Page |
| Bid Documents: | Please Login to View Page |
Description
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- Contract Opportunity Type: Solicitation (Original)
- Original Published Date: Jan 30, 2025 03:20 pm PST
- Original Date Offers Due: Feb 07, 2025 01:00 pm PST
- Inactive Policy: Manual
- Original Inactive Date: Feb 08, 2025
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Initiative:
- None
- Original Set Aside: Total Small Business Set-Aside (FAR 19.5)
- Product Service Code: 6625 - ELECTRICAL AND ELECTRONIC PROPERTIES MEASURING AND TESTING INSTRUMENTS
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NAICS Code:
- 334517 - Irradiation Apparatus Manufacturing
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Place of Performance:
Berkeley , CA 94720USA
1 - X-RAY diffractometer. The system must meet the following minimum technical requirements and capabilities.
1) High brightness Cu x-ray source and solid-state 2D area detector. 5kW or brighter, sealed or rotating anode.
2) Automated or user interchangeable optics to enable the following X-ray measurement types:
• Reflected beam optics: Bragg-Brentano, Parallel beam, Convergent spot-focused beam
• Transmission beam optics: focusing optics for high resolution measurements.
3) Integrated sample mounting and software integration to enable the following:
• High-throughput sample stage for min. 96 well-plate. Software/hardware automation for alignment/measurement.
• Horizontal sample mount for both high-throughput stage and single sample that has the ability to measure in both reflection and transmission mode.
• Heating stage with integrated temperature control and measurement from room temperature to 1000C or greater. Must be compatible with vacuum, ambient, inert and reactive gasses, to include hydrogen gas.
• Detection and guidance features to ensure proper optical path accessories are installed for the type of measurement being performed.
• Must have automated beam alignment.
4) Software requirements:
• Software must have a user-friendly interface, and the ability to save measurement presets and set user/administrator settings as this tool will be available as a non-specialist, multi-user capability.
• Software must enable external scripting (such as Python) for automating hardware sample positioning and measurement controls.
• Must include a comprehensive suite of data analysis capabilities, including: Rietveld refinement, texture analysis, whole pattern fitting, peak-fitting, thin-film reflectivity pattern analysis, and data visualization.
- 1 Cyclotron Rd
- Berkeley , CA 94720
- USA
- Anita Mathias
- amathias@lbl.gov
- Jan 30, 2025 03:20 pm PSTSolicitation (Original)
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