Scanning Electron Microscope (SEM) Detector Systems

Agency:	State Government of Texas
State:	Texas
Type of Government:	State & Local
NAICS Category:	334516 - Analytical Laboratory Instrument Manufacturing 811219 - Other Electronic and Precision Equipment Repair and Maintenance
Posted Date:	Aug 14, 2026
Due Date:	Aug 28, 2026
Solicitation No:	601440000052880
Original Source:	Please Login to View Page
Contact information:	Please Login to View Page
Bid Documents:	Please Login to View Page

Description

Follow Solicitation

Solicitation ID:

601440000052880

Status:

Addendum Posted

Contact Name:

Enrique Moya

Contact Number:

(512) 416-2105

Contact Email:

Enrique.Moya@txdot.gov

Response Due Date:

8/28/2026

Response Due Time:

3:00 PM

Agency/Texas SmartBuy Member Number:

601

Posting Requirement:

14+ Days for Entire Solicitation Package

State Agency Procurement Certification:

Dual CTCD/CTCM certification

Solicitation Posting Date:

8/14/2026

Last Modified:

8/14/2026 11:33 am

Class/Item Code:

49029-Electron Microscopy Equipment, Laboratory: Electron Microscopes, Vacuum Sputtering Systems, etc.;

Attachment URL: https://txdot.bonfirehub.com/portal/?tab=openOpportunities

Addendum:

8/14/2026 11:33 am: No addendum was posted at this time; solicitation documents were uploaded.

Solicitation Description:

This solicitation is to establish a contract for the purchase of two (2) Scanning Electron Microscope (SEM) detector systems, including delivery, installation, calibration, training, and a one (1) year service plan with up to three (3) optional one-year renewal periods, for the Texas Department of Transportation (TxDOT), Materials and Tests Division. All information or changes related to this solicitation will be posted on this website. Respondents should monitor this website for addendums, additional and revised documents, questions and answers, or other changes. The response due date specified on this posting is the due date for submitting responses. Response submittals will not be accepted after the response due date and time.

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Scanning Electron Microscope (SEM) Detector Systems

Description

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