66--Plasma-focused ion beam scanning electron microsco

Agency: HEALTH AND HUMAN SERVICES, DEPARTMENT OF
State: Federal
Type of Government: Federal
FSC Category:
  • 66 - Instruments and Laboratory Equipment
NAICS Category:
  • 334515 - Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals
Posted Date: Sep 22, 2025
Due Date:
Solicitation No: 75N92025Q00101
Original Source: Please Login to View Page
Contact information: Please Login to View Page
Bid Documents: Please Login to View Page

Description

Follow
66--Plasma-focused ion beam scanning electron microsco
Active
Contract Opportunity
Notice ID
75N92025Q00101
Related Notice
Contract Line Item Number
Department/Ind. Agency
HEALTH AND HUMAN SERVICES, DEPARTMENT OF
Sub-tier
NATIONAL INSTITUTES OF HEALTH
Office
NATIONAL INSTITUTES OF HEALTH NHLBI
Award Details
  • Contract Award Date: Sep 22, 2025
  • Contract Award Number: 75N92025P00391
  • Task/Delivery Order Number:
  • Contractor Awarded Unique Entity ID: CL4ELDSNT465
  • Contractor Awarded Name: FEI COMPANY
  • Contractor Awarded Address: Hillsboro , OR 97124 USA
  • Base and All Options Value (Total Contract Value): $1,800,000.00
General Information
  • Contract Opportunity Type: Award Notice (Original)
  • Original Published Date: Sep 22, 2025 03:15 pm EDT
  • Inactive Policy: 15 days after contract award date
  • Original Inactive Date: Oct 07, 2025
  • Initiative:
    • None
Classification
  • Original Set Aside:
  • Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
  • NAICS Code:
    • 334515 - Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals
  • Place of Performance:
Description
Plasma-focused ion beam scanning electron microscope (FIB-SEM)
Attachments/Links
Contact Information
Contracting Office Address
  • 6701 ROCKLEDGE DRIVE ROOM 6100
  • BETHESDA , MD 20892
  • USA
Primary Point of Contact
Secondary Point of Contact


History
  • Sep 22, 2025 03:15 pm EDTAward Notice (Original)

Related Document

Aug 12, 2025[Sources Sought (Original)] 66--Purchase of a Plasma-focused ion beam scanning electron microscope (FIB-SEM)
Sep 8, 2025[Combined Synopsis/Solicitation (Original)] Purchase of a Plasma-focused ion beam scanning ele
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