Micro x-ray source for defect detection in metallic AM structures

Agency: NATIONAL AERONAUTICS AND SPACE ADMINISTRATION
State: Virginia
Type of Government: Federal
FSC Category:
  • 66 - Instruments and Laboratory Equipment
NAICS Category:
  • 334519 - Other Measuring and Controlling Device Manufacturing
Set Aside: Total Small Business Set-Aside (FAR 19.5)
Posted Date: Jan 14, 2026
Due Date: Jan 20, 2026
Solicitation No: 80NSSC26922252Q
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Description

Follow
Micro x-ray source for defect detection in metallic AM structures
Active
Contract Opportunity
Notice ID
80NSSC26922252Q
Related Notice
Department/Ind. Agency
NATIONAL AERONAUTICS AND SPACE ADMINISTRATION
Sub-tier
NATIONAL AERONAUTICS AND SPACE ADMINISTRATION
Office
NASA SHARED SERVICES CENTER
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General Information View Changes
  • Contract Opportunity Type: Combined Synopsis/Solicitation (Updated)
  • Updated Published Date: Jan 14, 2026 11:48 am CST
  • Original Published Date: Jan 14, 2026 11:39 am CST
  • Updated Date Offers Due: Jan 20, 2026 04:00 pm CST
  • Original Date Offers Due: Jan 20, 2026 04:00 pm CST
  • Inactive Policy: 15 days after date offers due
  • Updated Inactive Date: Feb 04, 2026
  • Original Inactive Date: Feb 04, 2026
  • Initiative:
    • None
Classification
  • Original Set Aside: Total Small Business Set-Aside (FAR 19.5)
  • Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
  • NAICS Code:
    • 334519 - Other Measuring and Controlling Device Manufacturing
  • Place of Performance:
    Hampton , VA 23681
    USA
Description

NASA LaRC has a requirement for a Micro x-ray source for defect detection in metallic AM structures. See the attached SOW for full details of the requirement. All correspondence shough reference ID 80NSSC26922252Q in the subject line for visibility.


Attachments/Links
Contact Information
Contracting Office Address
  • JERRY HLASS ROAD, BLDG. 1111
  • STENNIS SPACE CENTER , MS 39529
  • USA
Primary Point of Contact
Secondary Point of Contact


History

Related Document

Jan 21, 2026[Combined Synopsis/Solicitation (Updated)] Micro x-ray source for defect detection in metallic AM structures
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