Integrated Si Photonics Measurement and Characterization Systems for Education and Workforce Development

The Research Foundation for SUNY at the University at Albany seeks proposals for two compact, self-contained measurement and characterization systems for silicon-based photonic integrated circuits (PIC) suitable for use in education and workforce development programming. The systems and the constitutive components must be delivered as two single configured units, both fully tested in terms of operability per the performance and size specifications outlined below. The two systems must be suitable for use in testing and characterizing passive and active PICs including but not limited to: on-chip optical waveguides, couplers, integrated optical detectors, interference and resonance devices, electro-optical modulators, and full electro-optical datalinks utilizing wavelength division multiplexing. This capability includes generation of eye-diagrams and bit error rate testing to characterize optical datalinks.