Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY

Agency: DEPT OF DEFENSE
State: New York
Type of Government: Federal
FSC Category:
  • J - Maintenance, Repair, and Rebuilding of Equipment
Posted Date: Feb 27, 2026
Due Date: Mar 6, 2026
Solicitation No: W911PT26QA041
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Description

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Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY
Active
Contract Opportunity
Notice ID
W911PT26QA041
Related Notice
Department/Ind. Agency
DEPT OF DEFENSE
Sub-tier
DEPT OF THE ARMY
Major Command
AMC
Sub Command
ACC
Sub Command 2
ACC-CTRS
Sub Command 3
ACC-DTA
Office
W6QK ACC WVA
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General Information
  • Contract Opportunity Type: Solicitation (Original)
  • Original Published Date: Feb 27, 2026 07:59 am EST
  • Original Date Offers Due: Mar 06, 2026 03:00 pm EST
  • Inactive Policy: 15 days after date offers due
  • Original Inactive Date: Mar 21, 2026
  • Initiative:
    • None
Classification
  • Original Set Aside:
  • Product Service Code: J036 - MAINT/REPAIR/REBUILD OF EQUIPMENT- SPECIAL INDUSTRY MACHINERY
  • NAICS Code:
    • 811210 - Electronic and Precision Equipment Repair and Maintenance
  • Place of Performance:
    Watervliet , NY 12189
    USA
Description

This solicitation is for the procurement of 1 LOT - Annual maintenance, support, repair and software updates to FEI Helios 600i Focused Ion Beam, (FIB) / Scanning Electron Microscope (SEM) Dual Beam per the attached Performance Work Statement (PWS) for Benet Laboratories. Wage Determination No.2015-4143 latest revision applies and is attached.



*** This is a Sole Source Procurement with FEI Company. All Responsible offerors will be considered. ***


Attachments/Links
Contact Information
Contracting Office Address
  • ACC WATERVLIET ARSENAL 1 BUFFINGTON ST
  • WATERVLIET , NY 12189-4050
  • USA
Primary Point of Contact
Secondary Point of Contact


History
  • Feb 27, 2026 07:59 am ESTSolicitation (Original)
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