Cryo-Focused Ion Beam (FIB) and scanning electron microscope (SEM)
| Agency: | Government of Canada |
|---|---|
| State: | Federal |
| Type of Government: | State & Local |
| NAICS Category: |
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| Posted Date: | Jan 29, 2026 |
| Due Date: | Feb 24, 2026 |
| Solicitation No: | 25-58269 |
| Original Source: | Please Login to View Page |
| Contact information: | Please Login to View Page |
| Bid Documents: | Please Login to View Page |
Description
Description
The objective of this procurement is to install Cryo-Focused Ion Beam and scanning electron microscope (Cryo FIB/SEM) for high volume etching capability in the Development and Analytical Microscopy team of the NRC Quantum Nanotechnology Research Centre. This new Cryo FIB/SEM will replace our aging microscope and be part of the QN microscopy suite of equipment.
The estimated contract period will be 14 month(s).
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World Trade Organization Agreement on Government Procurement (WTO GPA)
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Canada-Chile Free Trade Agreement (CCFTA)
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Canada-Peru Free Trade Agreement (CPFTA)
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Canada-Colombia Free Trade Agreement
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Canada-Panama Free Trade Agreement
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Canada-Honduras Free Trade Agreement
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Canada-Korea Free Trade Agreement (CKFTA)
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Canadian Free Trade Agreement (CFTA)
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Canada-European Union Comprehensive Economic and Trade Agreement (CETA)
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Comprehensive and Progressive Agreement for Trans-Pacific Partnership (CPTPP)
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Canada-Ukraine Free Trade Agreement (CUFTA)
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Canada-UK Trade Continuity Agreement (Canada-UK TCA)
A contracting officer can use limited tendering for specific reasons outlined in the applicable trade agreements. The reason for this contract is described below:
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None
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